Trademark247.com - Trademark Search Results

Showing 1-20 of 23 results

Mark Name	Mark Description
LITEL MAC Owned by: LITEL INSTRUMEN... Filed on: 10-26-2012 Status: Abandoned-Failure to Resp...	Computer hardware and computer software programs for the integration of text, audio, graphics, still images and moving pictures into an interact	View Details Monitor Mark Create New Watchlist
LITEL GPP Owned by: LITEL INSTRUMEN... Filed on: 10-25-2012 Status: Abandoned-Failure to Resp...	Computer software for processing digital images; Vehicle detection equipment, namely, display monitors, computers, image sensors, video cameras,	View Details Monitor Mark Create New Watchlist
HYPER NA ISI Owned by: LITEL INSTRUMEN... Filed on: 10-23-2006 Status: Cancelled-Section 8	Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing d	View Details Monitor Mark Create New Watchlist
HEIGHT MAPPER (ZMAP) Owned by: LITEL INSTRUMEN... Filed on: 09-22-2006 Status: Abandoned-Express	Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing d	View Details Monitor Mark Create New Watchlist
HYPER NA SMI Owned by: LITEL INSTRUMEN... Filed on: 09-22-2006 Status: Cancelled-Section 8	Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing d	View Details Monitor Mark Create New Watchlist
POLARIZATION MAPPER (PMAP... Owned by: LITEL INSTRUMEN... Filed on: 09-18-2006 Status: Abandoned-Express	Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing d	View Details Monitor Mark Create New Watchlist
LUMENA Owned by: LITEL INSTRUMEN... Filed on: 03-22-2005 Status: Abandoned-Failure to Resp...	optical metrology product that provides an accurate measurement of the Numerical Aperture of a lithography tool and variation of same across the	View Details Monitor Mark Create New Watchlist
PREDICTIVELITHOGRAPHY Owned by: LITEL INSTRUMEN... Filed on: 03-14-2005 Status: Abandoned-Express	An emulator for semiconductor lithographic projection tools (steppers and scanners) that combines precise characterization of the tool using in-	View Details Monitor Mark Create New Watchlist
HIGH ACCURACY INSPECSTEP ... Owned by: LITEL INSTRUMEN... Filed on: 06-14-2004 Status: Cancelled-Section 8	Interferometer and software package for analyzing semiconductor chip optical test structure data received from an overlay tool, sold as a unit	View Details Monitor Mark Create New Watchlist
ADVANCED SOURCE METROLOGY... Owned by: LITEL INSTRUMEN... Filed on: 04-14-2004 Status: Cancelled-Section 8	Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing d	View Details Monitor Mark Create New Watchlist
HIGH ACCURACY IN-SITU INT... Owned by: LITEL INSTRUMEN... Filed on: 04-14-2004 Status: Cancelled-Section 8	Interferometer and software package for analyzing numerical bar-in-bar offset or shift data received from an overlay tool sold as a unit	View Details Monitor Mark Create New Watchlist
HIGH ACCURACY SOURCE METR... Owned by: LITEL INSTRUMEN... Filed on: 04-14-2004 Status: Cancelled-Section 8	Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing d	View Details Monitor Mark Create New Watchlist
DISTORTION MAPPER (DMAP) Owned by: LITEL INSTRUMEN... Filed on: 02-26-2004 Status: Cancelled-Section 8	optical distortion mapping device comprised of computer software and reticle for determining distortion of a lithographic projection tool	View Details Monitor Mark Create New Watchlist
TRANSMISSION MAPPER (TMAP... Owned by: LITEL INSTRUMEN... Filed on: 02-26-2004 Status: Cancelled-Section 8	Combination of a software package and a specialized reticle for use in determining the state of the lens angular transmittance of an optical pro	View Details Monitor Mark Create New Watchlist
LITEL INSTRUMENTS Owned by: LITEL INSTRUMEN... Filed on: 01-20-2004 Status: Abandoned-Failure to Resp...	Litel Instruments is a privately held company based in San Diego, California USA; Litel is dedicated to adding value to the semiconductor photol	View Details Monitor Mark Create New Watchlist
IN-SITU INTERFEROMETER (I... Owned by: LITEL INSTRUMEN... Filed on: 01-16-2004 Status: Cancelled-Section 8	interferometer and a software package for analyzing data received from an overlay tool	View Details Monitor Mark Create New Watchlist
INSPECSTEP INTERFEROMETER... Owned by: LITEL INSTRUMEN... Filed on: 01-16-2004 Status: Cancelled-Section 8	interferometer and a software package for analyzing data received from an overlay tool	View Details Monitor Mark Create New Watchlist
SOURCE METROLOGY INSTRUME... Owned by: LITEL INSTRUMEN... Filed on: 01-16-2004 Status: Cancelled-Section 8	Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing d	View Details Monitor Mark Create New Watchlist
PREDICTIVE LITHOGRAPHY Owned by: LITEL INSTRUMEN... Filed on: 01-12-2004 Status: Abandoned-Failure to Resp...	combination of lithographic exposure tool diagnostics and mathematical techniques to predict a priori the feature printed	View Details Monitor Mark Create New Watchlist
USE THE STANDARD Owned by: LITEL INSTRUMEN... Filed on: 07-14-2003 Status: Cancelled-Section 8	metrology tools for characterizing the properties of illumination sources of photolithography steppers and step-and-scan apparatus for semicondu	View Details Monitor Mark Create New Watchlist

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